• Highly aligned organic semiconductor thin films grown by hot wall epitaxy

  Publication Year: 2002

  ANDREEV, A. RESEL, R. SMILGIES, D. SITTER, H. SARICIFTCI, N. LYSÁČEK, D. VÁLEK, L.

• Holographic confocal microscopy

  Publication Year: 2002

  CHMELÍK, R. HARNA, Z. ANTOŠOVÁ, I. LOVICAR, L. MACHÁLEK, M. ZLÁMALOVÁ, M.

• In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films

  Publication Year: 2002

  SPOUSTA, J., ŠIKOLA, T., ZLÁMAL, J., URBÁNEK, M., NAVRÁTIL, K., JIRUŠE, J., CHMELÍK, R., NEBOJSA, A.

• Influence of Magnetism on Results of Ab Initio Calculations of Mechanical Properties of Crystals

  Publication Year: 2002

  ČERNÝ, M., ŠANDERA, P., POKLUDA, J., ŠOB, M.

• Intense XUV emission generated by a capillary discharge based apparatus.

  Publication Year: 2002

  TOMASSETTI, G. RITUCCI A. KUKHLEVSKY, S.V. KAISER, J. PALLADINO, L. REALE, L. FLORA, F. MEZI, L. KOZMA, I. Z. LIMONGI, T. SAMEK, O. LIŠKA, M.

• Investigation of pulse characteristics of 46,9 nm Ar capillary discharge soft x-ray laser.

  Publication Year: 2002

  RITUCCI, A. –TOMASSETTI, G. –PALLADINO, L. –REALE, L. –GAETA, G. –FLORA, F. –MEZI, L. –KUKHLEVSKY, S.V. –KAISER, J. –FAENOV, A. –PIKUZ, T.

• Kvantifikace detekční účinnosti detektoru sekundárních elektronů v REM.

  Publication Year: 2002

  KONVALINA I.

• Low-temperature epitaxial growth of the quaternary wide band gap semiconductor SiCAlN

  Publication Year: 2002

  ROUČKA, R., TOLLE, J., CROZIER, P., CHIZMESHYA, A., TSONG, I., KOUVETAKIS, J., POWELEIT, C., SMITH, D.

• Low-temperature epitaxial growth of the quaternary wide band gap semiconductor SiCAlN

  Publication Year: 2002

  ROUČKA, R., TOLLE, J., CROZIER, P., CHIZMESHYA, A., TSONG, I., KOUVETAKIS, J., POWELEIT, C., SMITH, D.

• Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates

  Publication Year: 2002

  ROUČKA, R., TOLLE, J., CROZIER, P., TSONG, I., KOUVETAKIS, J., SMITH, D.

• Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates

  Publication Year: 2002

  ROUČKA, R., TOLLE, J., CROZIER, P., TSONG, I., KOUVETAKIS, J., SMITH, D.

• New method for the complete analysis of thin films non-uniform in optical parameters

  Publication Year: 2002

  OHLÍDAL, M., OHLÍDAL, I., FRANTA, D., ČUDEK, V.

• Noncontact three-dimensional surface profiling using reflected light holographic confocal microscopy

  Publication Year: 2002

  ANTOŠOVÁ, I., HARNA, Z.

• Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method

  Publication Year: 2002

  OHLÍDAL, M., OHLÍDAL, I., FRANTA, D., KRÁLÍK, T., JÁKL, M., ELIÁŠ, M.

• PC Software for Laboratory Measurement.

  Publication Year: 2002

  DOLOŽÍLEK, M., RYNDOVÁ, A.

Showed 1051–1065 from 1305 results