• Analytic description of wave fields in focal regions of diffractive lenses

  Publication Year: 1996

  CHMELÍK, R.

• Application of DIPS to Surface Roughness Determination by Shearing Interferometry

  Publication Year: 1996

  OHLÍDAL, M., OHLÍDAL, I.

• Intergranular Branching of Brittle Cracks in Voronoi Tesselation

  Publication Year: 1996

  ŠANDERA, P., POKLUDA, J.

• Kerr induced limit of effective interaction length of photoinduced SHG

  Publication Year: 1996

  PETRÁČEK, J.

• Modelling Intergranular Crack Growth in 2D and 3D Voronoia Cells

  Publication Year: 1996

  ŠANDERA, P., PONÍŽIL, P., POKLUDA, J.

• Plasma temperature of an arc discharge

  Publication Year: 1996

  PEŠKA, L. HOUŠKA, A. AUBRECHT, V. BARTL, J.

• A method of shearing interferometry for determining the statistical quantities of randomly rough surface of solids

  Publication Year: 1995

  OHLÍDAL, M., OHLÍDAL, I.,DRUCKMÜLLER, M., FRANTA, D.

• Advanced Optical Waveguide Structures

  Publication Year: 1995

  BORDMAN, A.D., SINGH, K., XIE, K., EGAN, P., PETRÁČEK, J.

• Comparison of two-dimensional Fraunhofer approximation and two-dimensional Fresnel approximation at analysis of surface roughness by angle speckle correlation. II Experimental results

  Publication Year: 1995

  OHLÍDAL, M.

• Evaluation of Saturation of Photoinduced Second-Harmonic Generation in Doped Glass Fibers

  Publication Year: 1995

  CHMELA, P., PETRÁČEK, J., FALCIAI, R., PASCUCCI, T., ROMOLINI, A.

• New Courses with Computers in the Physics Curriculum at a Technical University

  Publication Year: 1995

  DOLOŽÍLEK, M.

• Scattering of Light from Multilayer systems with rough boundaries

  Publication Year: 1995

  OHLÍDAL, I., NAVRÁTIL, K., OHLÍDAL, M.

• Some Features of Famulus, MathCad, and Spreadsheet for Computer Based Learning in Physics

  Publication Year: 1995

  DOLOŽÍLEK, M., LOH, E.

• The Dependence of the Sound Reduction Factor on the Area of the Testing Element

  Publication Year: 1995

  DOLOŽÍLEK, M., ČURDA, Z., RYNDOVÁ, A., VAŇKOVÁ, M.

• An in situ study of processes taking place on a silicon surface during bombardment by CFx/Ar ions - etching versus polymerization

  Publication Year: 1994

  ŠIKOLA, T., ARMOUR, D., VAN DEN BERG, J.

Showed 1276–1290 from 1304 results