Publication detail

Diagnostics of analogue integrated circuits

KOLAŘÍK, V. MUSIL, V.

English title

Diagnostics of analogue integrated circuits

Type

conference paper

Language

en

Original abstract

Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components – Workshop. Proceedings

English abstract

Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components – Workshop. Proceedings

Keywords in English

electronics, integrated circuits, diagnostics, noise

RIV year

2001

Released

12.09.2001

Publisher

Ing. Zdeněk Novotný, CSc.

Location

Brno

ISBN

80-214-1960-1

Book

Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings

Pages count

8

BIBTEX


@inproceedings{BUT4536,
  author="Vladimír {Kolařík} and Vladislav {Musil},
  title="Diagnostics of analogue integrated circuits",
  booktitle="Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings",
  year="2001",
  month="September",
  publisher="Ing. Zdeněk Novotný, CSc.",
  address="Brno",
  isbn="80-214-1960-1"
}