Detail publikace
Diagnostics of analogue integrated circuits
KOLAŘÍK, V. MUSIL, V.
Anglický název
Diagnostics of analogue integrated circuits
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
en
Originální abstrakt
Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components – Workshop. Proceedings
Anglický abstrakt
Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components – Workshop. Proceedings
Klíčová slova anglicky
electronics, integrated circuits, diagnostics, noise
Rok RIV
2001
Vydáno
12.09.2001
Nakladatel
Ing. Zdeněk Novotný, CSc.
Místo
Brno
ISBN
80-214-1960-1
Kniha
Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings
Počet stran
8
BIBTEX
@inproceedings{BUT4536,
author="Vladimír {Kolařík} and Vladislav {Musil},
title="Diagnostics of analogue integrated circuits",
booktitle="Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings",
year="2001",
month="September",
publisher="Ing. Zdeněk Novotný, CSc.",
address="Brno",
isbn="80-214-1960-1"
}