Detail publikace

Aberration correction for low voltage optimized transmission electron microscopy

BAČOVSKÝ, J.

Anglický název

Aberration correction for low voltage optimized transmission electron microscopy

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

en

Originální abstrakt

Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-voltage design seems to be a challenging task. The benefits and potential of the Rose hexapole corrector implemented to such a system are critically considered in this paper. The feasibility of miniaturized corrector suitable for desktop LVEM is especially discussed, including the aspect of corrector contribution to chromatic aberration that appears to be crucial. Optimal corrector parameters and resolution limits of such a system are proposed. Improved spatial resolution Spherical aberration correction Permanent magnet transfer lenses (C) 2018 DELONG INSTRUMENTS a.s. Published by Elsevier B.V.

Anglický abstrakt

Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-voltage design seems to be a challenging task. The benefits and potential of the Rose hexapole corrector implemented to such a system are critically considered in this paper. The feasibility of miniaturized corrector suitable for desktop LVEM is especially discussed, including the aspect of corrector contribution to chromatic aberration that appears to be crucial. Optimal corrector parameters and resolution limits of such a system are proposed. Improved spatial resolution Spherical aberration correction Permanent magnet transfer lenses (C) 2018 DELONG INSTRUMENTS a.s. Published by Elsevier B.V.

Klíčová slova anglicky

Low voltage transmission electron microscopy; Aberration correction; Hexapole corrector

Vydáno

25.08.2018

Nakladatel

Elsevier

Místo

AMSTERDAM

ISSN

2215-0161

Ročník

5

Číslo

1

Strany od–do

1033–1047

Počet stran

15

BIBTEX


@article{BUT169885,
  author="Jaromír {Bačovský},
  title="Aberration correction for low voltage optimized transmission electron microscopy",
  year="2018",
  volume="5",
  number="1",
  month="August",
  pages="1033--1047",
  publisher="Elsevier",
  address="AMSTERDAM",
  issn="2215-0161"
}